DEC DEFPA-UB PCI / FDDI Adapter

fpkit290.zip DEC FDDIcontroller/PCI DOS-based Distribution Diskette V2.90
ffmgt110.zip DEC FDDIcontroller Network Management Tool V1.10 Full Kit

DEC FDDIcontroller/PCI Installation (EK-DEFPA-IN)
FDDI System Level Description (EK-FDSLD-SD-002)
FDDI Network Configuration Guidelines (EK-DFDDI-CG-01)
FDDI Adapters Technical Data (official website, archived)

DEC DEFPA-UB Adapter
Specifications
PHY LED (Diagnostics)


DEC DEFPA-UB Adapter 54-22499

D4 PHY LED
E4 MC68HC000FN16
E9 AMD PALCE
E10 AM79865JC Physical Data Transmitter
E11 AM79866AJC Physical Data Receiver
E16 SC02PH019DH02 21-40779-02
E17,18 HY514260B JC-70
E20 DP83223V Twisted Pair Transceiver
E22 VLSI VY06780 21-34812-04
E23 LAN ADRS
E24, 25 N28F001
E28 MC68848PV
E31 M5M44266-BJ
J3 Unk
J4 Port A - UTP (called MJ by DEC)
T1 Pulse PE-68517
T2, 3 TDK ZJYS-2
Y1 50.0000 MHz osc

Specifications

The major components on the adapter are as follows:

  • 1 megabyte of packet memory
  • 68000 onboard processor
  • DMA control
  • 32-bit, 33 MHz PCI bus interface
  • FDDI interface chipset
  • IEEE address ROM
  • Onboard, nonvolatile memory for firmware storage

DC amps @ +5.0 V, 1.1 A - SAS UTP
DC amps @ +12.0 V, 0.1 A (maximum)
Bus loading - per PCI standard, Revision 2.0


PHY LED (Diagnostics)

Color Status Condition
Green On PHY connection complete
Green Blinking PHY connection in progress (or no cable attached)
Amber On If on after system boots, indicates port or Link Confidence Test (LCT) failure; retry loop
If on before system boots, indicates self-test failure
Green / Amber Blinking Alternating—(DEFPA-DA and DEFPA-MA only)
None
Off
Port disabled by management or LED or adapter fails
  1. Turn on power to the computer and observe the PHY LED.
  2. Note the following events (within 10 seconds after the computer power is turned on):
    1. The PHY LED flashes green (three flashes) for approximately 1 second.
    2. The PHY LED turns off when the adapter passes the powerup self-test.
      A steady amber LED indicates a powerup self-test failure.

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Louis F. Ohland, Peter H. Wendt, David L. Beem, William R. Walsh, Tatsuo Sunagawa, Tomáš Slavotínek, Jim Shorney, Tim N. Clarke, Kevin Bowling, and many others.

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